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首页 >>> 产品目录 >>> 涂层测厚仪 >>> 德国菲希尔Fischer MPOR涂层测厚仪
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产品[德国菲希尔DUALSCOPE® FMP20涂层测厚仪[产品打印页面]]资料
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产品名称:
德国菲希尔DUALSCOPE® FMP20涂层测厚仪
产品型号:
FMP20涂层测厚仪
产品展商:
时代仪器
简单介绍
德国菲希尔DUALSCOPE® FMP20涂层测厚仪;德国菲希尔DUALSCOPE® FMP20涂层测厚仪采用了磁性和涡流两种测厚方法;德国菲希尔DUALSCOPE® FMP20涂层测厚仪能够自动根据基材的不同而切换到相应的工作模式
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| 德国菲希尔DUALSCOPE® FMP20涂层测厚仪的详细介绍 |
德国菲希尔DUALSCOPE® FMP20涂层测厚仪德国菲希尔DUALSCOPE® FMP20涂层测厚仪采用了磁性和涡流两种测厚方法,可无损地测量磁性金属基体( 如钢、铁、合金和硬磁性钢等 )上非磁性覆盖层的厚度(如铝、铬、铜、珐琅、橡胶、油漆等)及非磁性金属基体(如铜、铝、锌、锡等)上非导电覆盖层的厚度(如:珐琅、橡胶、油漆、塑料等)。 德国菲希尔DUALSCOPE® FMP20涂层测厚仪能够自动根据基材的不同而切换到相应的工作模式 具有磁感应和涡流各自的校准和零位功能 连续测量功能,能得出稳定的结果 大窗口液晶带二行点阵对话显示,操作更明确 公英制单位设置 上下限设置,一旦超限,有不同的蜂鸣声提示音 具有数据统计功能:平均值、最大值、最小值、标准偏差、测量次数 键盘锁功能,防止误校准 另购传输软件和专用电缆可将仪器里的数据传输到电脑的Excel界面,方便编辑和打印。 新款DUALSCOPE® FMP40作为FMP30-40系列的一部分,比标准版仪器具有更广泛的可用性。
这些仪器集成了许多附加的功能,如最多可达100个应用程式及相应的统计学和图形评估。
将容差限输入可校准应用程式后,生产过程可以进行统计地分析。常规模式可以转换到矩阵模式,以便于进行多点相关联的测试。. FMP10,FMP20,FMP30,FMP40涂层测厚仪技术参数 FD10双功能探头测量参数:磁感应:测量范围:0~1500μΜ(0~60 mils)测量精度:0~50 μΜ:0.2 μΜ 50~1500μΜ: 1 %。涡流:测量范围:0~1200μΜ(0~48 mils)测量精度:0~100 μΜ:0.5 μΜ,100~1200μΜ: 0.5 %
以上介绍的只是其中极小一部分的功能特性。 - Automatic base material recognition
- For magnetic inductive and eddy current probes
Features additional to those of the Basic series: - Memory for up to 20,000 readings
- Up to 100 calibratable applications
- Capability of allocating readings into up to 4,000 Blocks
- Date and time stamp for blocks
- Statistics display of common characteristic values in the block and final results. Output of characteristic variance-analytical values
- Graphical measurement display as a histogram with a Gaussian plot
- Capability of entering process tolerance limits and computation of the associated process capability indices cp and cpk
- Audible and visual warning when tolerance limits are exceeded
- Free-running display with additional presentation of the reading as an analog bar between the tolerance limits
- External key-triggered measurement acquisition, e.g., in hollow cylinders with small diameters
- Option to calibrate through an unknown coating (with magnetic induction method only)
- Capability to enable matrix measurement mode for connected multi-point measurements
- Capability of averaging measurement data: Only the mean value of several readings will be stored
- Measurement acquisition through area measurement possible: Only the single readings until probe lift-off are captured and averaged
- Capability to measure continuously with the probe placed on the specimen
- Outlier rejection for the automatic elimination of erroneous measurements
- Correction of any stored reading
- Application linking mode: Ability for common normalization/calibration of applications
- Designations for applications through the optional PC program MP-Name
- USB port to a printer
- Battery and line power operation
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